CERN Accelerating science

CERN Published Articles

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2017-03-24
06:00
2-D particle-in-cell simulations of high efficiency klystrons / Constable, David A (Lancaster U.) ; Lingwood, Chris (Lancaster U.) ; Burt, Graeme (Lancaster U.) ; Syratchev, Igor (CERN) ; Marchesin, Rodolphe (Thales Electron Devices, Velizy) ; Baikov, Andrey Yu (Unlisted, RU) ; Kowalczyk, Richard (Unlisted, US, CA)
Currently, klystrons employing monotonic bunching offer efficiencies on the order of 70%. Through the use of the core oscillation electron bunching mechanism, numerical simulations have predicted klystrons with efficiencies up to 90%. [...]
2016 - 2 p. - Published in : 10.1109/IVEC.2016.7561813
In : 17th IEEE International Vacuum Electronics Conference, Monterey, CA, USA, 19 - 21 Apr 2016, pp.7561813

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2017-03-24
06:00
Design and Performance of the BCM1F Front End ASIC for the Beam Condition Monitoring System at the CMS Experiment / Przyborowski, Dominik (AGH-UST, Cracow) ; Kaplon, Jan (CERN) ; Rymaszewski, Piotr (AGH-UST, Cracow)
We present the design and the test results of the BCM1F front end ASIC designed for readout of diamond sensors used in the Beam Condition Monitoring system at the Compact Muon Solenoid (CMS) experiment built in the European Organization for Nuclear Research (CERN) in Geneva. The design comprises a fast transimpedance preamplifier with active feedback, a shaper stage and high-performance differential output buffer. [...]
2016 - 9 p. - Published in : IEEE Trans. Nucl. Sci. 63 (2016) 2300-2308

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2017-03-24
06:00
Radiation Vulnerability in 65 nm CMOS I/O Transistors after Exposure to Grad Dose / Ding, Lili (U. Padua (main)) ; Gerardin, Simone (U. Padua (main)) ; Bagatin, Marta (U. Padua (main)) ; Mattiazzo, Serena (U. Padua (main)) ; Bisello, Dario (INFN, Padua) ; Paccagnella, Alessandro (U. Padua (main))
We studied the TID response of I/O 65 nm MOSFETs, which are strong candidates for LHC upgrade. Enhanced radiation vulnerability in I/O transistors appeared, due to radiation-induced interface states and charge accumulation..
2015 - 5 p. IEEE Nucl.Sci.Symp.Conf.Rec. - Published in : 10.1109/RADECS.2015.7365655
In : Conference on Radiation and its Effects on Components and Systems, Moscow, Russia, 14 - 18 Sep 2015, pp.7365655

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2017-03-23
17:20
CERN Analysis Preservation: A Novel Digital Library Service to Enable Reusable and Reproducible Research / Dallmeier-Tiessen, Sunje (CERN) ; Chen, Xiaoli (University of Sheffield (GB)) ; Dani, Anxhela (Alexander Techn. Educational Inst. of Thessaloniki (ATEI) (GR)) ; Dasler, Robin Lynnette (CERN) ; Delgado Fernandez, Javier (CERN) ; Fokianos, Pamfilos (CERN) ; Herterich, Patricia Sigrid (Humboldt-Universitaet zu Berlin (DE)) ; Simko, Tibor (CERN)
The latest policy developments require immediate action for data preservation, as well as reproducible and Open Science. To address this, an unprecedented digital library service is presented to enable the High-Energy Physics community to preserve and share their research objects (such as data, code, documentation, notes) throughout their research process. [...]
CERN-OPEN-2017-019.- Geneva : CERN, 2016 - 10 p. - Published in : Lect.Notes Comput.Sci. 9819 (2016) 347-356 Article: PDF; Fulltext: PDF;

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2017-03-23
14:11
Ionizing Energy Depositions After Fast Neutron Interactions in Silicon / Bergmann, Benedikt (IEAP CTU, Prague) ; Pospisil, Stanislav (IEAP CTU, Prague) ; Caicedo, Ivan (IEAP CTU, Prague) ; Kierstead, James (Brookhaven) ; Takai, Helio (Brookhaven) ; Frojdh, Erik (CERN)
In this study we present the ionizing energy depositions in a 300 μm thick silicon layer after fast neutron impact. With the Time-of-Flight (ToF) technique, the ionizing energy deposition spectra of recoil silicons and secondary charged particles were assigned to (quasi-)monoenergetic neutron energies in the range from 180 keV to hundreds of MeV. [...]
2016 - Published in : IEEE Trans. Nucl. Sci. 63 (2016) 2372-2378

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2017-03-23
14:03
Embedded Detection and Correction of SEU Bursts in SRAM Memories Used as Radiation Detectors / Secondo, R. (CERN) ; Foucard, G. (CERN) ; Danzeca, S. (CERN) ; Losito, R. (CERN) ; Peronnard, P. (CERN) ; Masi, A. (CERN) ; Brugger, M. (CERN) ; Dusseau, L. (Montpellier U.)
SRAM memories are widely used as particle fluence detectors in high radiation environments, such as in the Radiation Monitoring System (RadMon) currently in operation in the CERN accelerator complex. Multiple Cell Upsets (MCUs), arising from micro-latchup events, are characterized by a large number of SEUs, ultimately affecting the measurement of particle fluxes and resulting in corrupted data and accuracy losses. [...]
2016 - Published in : IEEE Trans. Nucl. Sci. 63 (2016) 2168-2175

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2017-03-23
13:44
Heavy-Ion Radiation Impact on a 4Mb FRAM under Different Test Conditions / Gupta, V. (Montpellier U.) ; Bosser, A. (Montpellier U.) ; Tsiligiannis, G. (CERN) ; Zadeh, A. (ESTEC, Noordwijk) ; Javanainen, A. (Vanderbilt U. (main)) ; Virtanen, A. (Jyvaskyla U.) ; Puchner, H. (Cypress Semicond., Aerosp. & Defense, San Jose) ; Saigne, F. (Montpellier U.) ; Wrobel, F. (Montpellier U.) ; Dilillo, L. (Montpellier U.)
The impact of heavy-ions on commercial Ferroelectric Memories (FRAMs) is analyzed. The influence of different test modes (static and dynamic) on this memory is investigated. [...]
2015
In : Conference on Radiation and its Effects on Components and Systems, Moscow, Russia, 14 - 18 Sep 2015, pp.7365617

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2017-03-23
13:34
Distributed Optical Fiber Radiation Sensing at CERN High Energy AcceleRator Mixed Field Facility (CHARM) / Toccafondo, I. (CERN ; Sant'Anna School Adv. Studies, Pisa) ; Thornton, A. (CERN) ; Guillermain, E. (CERN) ; Kuhnhenn, J. (Fraunhofer Inst., Euskirchen) ; Mekki, J. (CERN) ; Brugger, M. (CERN) ; Di Pasquale, F. (Sant'Anna School Adv. Studies, Pisa)
The first results of distributed optical fiber radiation sensing measurements based on radiation induced attenuation (RIA) at the new mixed-field irradiation facility CHARM are presented..
2015
In : Conference on Radiation and its Effects on Components and Systems, Moscow, Russia, 14 - 18 Sep 2015, pp.7365601

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2017-03-23
13:06
A Methodology for the Analysis of Memory Response to Radiation through Bitmap Superposition and Slicing / Bosser, A. (Jyvaskyla U.) ; Gupta, V. (Montpellier U.) ; Tsiligiannis, G. (CERN) ; Ferraro, R. (Montpellier U.) ; Frost, C. (Rutherford) ; Javanainen, A. (Jyvaskyla U.) ; Puchner, H. (Cypress Semicond., Technol., San Jose) ; Rossi, M. (Jyvaskyla U.) ; Saigne, F. (Montpellier U.) ; Virtanen, A. (Jyvaskyla U.) et al.
A methodology is proposed for the statistical analysis of memory radiation test data, with the aim of identifying trends in the single-even upset (SEU) distribution. The treated case study is a 65nm SRAM irradiated with neutrons, protons and heavy-ions..
2015 - Published in : 10.1109/RADECS.2015.7365578
In : Conference on Radiation and its Effects on Components and Systems, Moscow, Russia, 14 - 18 Sep 2015, pp.7365578

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2017-03-22
16:20
Staircase and saw-tooth field emission steps from nanopatterned n-type GaSb surfaces / Kildemo, M. (Norwegian U. Sci. Tech.) ; Inntjore Levinsen, Y. (Norwegian U. Sci. Tech. ; CERN) ; Le Roy, S. (Lab. Surface du Verre et Interfaces, Aubervilliers) ; Søndergård, E. (Lab. Surface du Verre et Interfaces, Aubervilliers)
High resolution field emission experiments from nanopatterned GaSb surfaces consisting of densely packed nanocones prepared by low ion-beam-energy sputtering are presented. Both uncovered and metal-covered nanopatterned surfaces were studied. [...]
2009 - Published in : J. Vac. Sci. Technol. A 27 (2009) L18-L23

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