CERN Accelerating science

Theses
Report number DESY-THESIS-2013-021
Title Impact of Irradiations by Protons with different Energies on Silicon Sensors
Author(s) Neubüser, Coralie (Hamburg U.)
Publication 124 p.
Thesis note Master : Hamburg U. : 2013
Thesis supervisor(s) Garutti, Erika ; Hansen, Wolfgang
Note presented Jan 2013
Subject category Detectors and Experimental Techniques
Accelerator/Facility, Experiment CERN LHC ; CMS
RD50
Abstract In the frame of the CMS tracker upgrade campaign the radiation damage of oxygen- rich n-type silicon pad diodes induced by 23 MeV and 23 GeV protons was investigated. The diodes were manufactured by Hamamatsu Photonics. After irradiation with 1 MeV neutron equivalent fluences between $1 \times 10^{11} \rm{cm}^{-2}$ and $1.5 \times 10^{15} \rm{cm}^{-2}$, the sensors were electrically characterized by means of capacitance-voltage (CV) and current-voltage (IV) measurements. Current pulses recorded by the Transient Current Technique (TCT) and Charge Collection Eciency (CCE) measurements show a dependence of the bulk damage on the proton energy. At a fluence of $\Phi_{eq} \approx 3 \times 10^{14} \rm{cm}^{-2}$ oxygen-rich n-type diodes demonstrate clear Space Charge Sign Inversion (SCSI) after 23 MeV proton irradiation. This effect does not appear after the irradiation with 23 GeV protons. Moreover, RD50 pad diodes were irradiated with 23 MeV protons, electrically characterized and compared to results obtained after 23 GeV irradiations. Our previous observation on the energy dependence of the radiation damage could be confirmed. In order to get a deeper understanding of the differences of the radiation induced defects, the Deep Level Transient Spectroscopy (DLTS) and Thermally Stimulated Current Technique (TSC) were utilized. Defects with impact on the space charge could be identied and characterized and it was possible to find some hints for the reason of the SCSI after 23 MeV proton irradiation. Moreover, a dependence on the oxygen concentration of the sensors could be observed.

Corresponding record in: Inspire

 Record created 2018-08-25, last modified 2019-06-03


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